Avenger II Technical Specifications |
Weight: |
1.76lb (0.79kg) with battery |
Dimensions (H x W x D) with case: |
4.61 in. x 6.92 in. x 2.20 in. (117 mm x 176 mm x 56 mm) |
Operating Temperature: |
32 °F to 131 °F (0 °C to 55 °C) |
Connector type: |
LEMO (Size 00) 2 Nos. |
Power Source: |
Lithium-Ion Battery pack 7.2VDC, 4AH, gives 8 hours continuous operation from fully charged battery |
Charger: |
Input voltage 100 to 250 VAC. Charge status indicators provided. |
Display type: |
5 Inch color wide VGA LCD/TFT display with higher resolution LCD for better signal representation and better visibility with different color sets |
Display size: |
800 x 480 pixels, screen size 4.25 in. x 2.52 in. (108 mm x 64 mm) |
Test Range: |
0.100 in. to 400 in. (2.5 mm to 10 meters) [in steel]. Fine mode adjustable in steps of 0.001/0.01/0.1 or 1 in. (0.01/0.1 or 1 mm). |
Measurement Unit: |
Metric or Imperial unit of measurement is selectable. |
Damping: |
Damping high/low is selectable |
Delay: |
30 in. (120 mm) adjustable |
Velocity: |
40 in/millisecond to 600 in/millisecond (1000 m/sec to 15000 m/sec). Fine mode adjustable in steps of 0.1 in/ millisecond (1 m/sec). |
Gain: |
100dB calibrated gain adjustable in 0.1,0.5, 1, 2, 6, or 14 dB steps |
Rejection: |
0 to 125% FSH |
Rectification: |
Full wave rectified with filtering |
Frequency: |
Broad Band amplifier 0.5 MHz to 15 MHz |
Linearity Deviation: |
Vertical: +3 %, Horizontal + 0.5% |
Test Mode: |
Pulse echo and Transmit/Receive |
Update Rate: |
50 Hz |
Monitor: |
Dual gate adjustable in 1% of Screen width with Positive/Negative Logic, Gate Expand modes |
A-Scan memory: |
500 Trace Patterns can be stored (with Note/Detail), recalled, or transferred to PC via USB port. A scan trace patterns can be directly stored on SD card or USB disk. |
USB and SD card: |
External USB disk and Micro SD card (up to 32GB) ports provided for data storage |
Calibration Set-up: |
50 different calibration set-ups can be Stored and Recalled |
Software: |
Avengsoft Interface software for transferring A-Scan from AVENGER II to PC is supplied |
Reference A-Scan: |
Reference A-Scan pattern of standard test object can saved and recalled in the background for easy comparison during testing |
Echo Dynamics: |
Echo dynamic pattern display |
DAC: |
Dynamic DAC curve can be digitally plotted (Smooth bolic curve) on screen with selectable offset curves from 0dB to 14dB in 0.5 dB selectable steps. DAC curve can be set as flaw monitor gate. Using minimum 2 to maximum 10 points. |
DGS: |
Defect size evaluation using predefined probe settings and custom probe set-ups, ERS (Equivalent Reflector Size) can also be displayed on the screen |
AWS: |
Built in Software for Evaluation of defects in accordance with AWS Specification D1.1. |
Built-In UT Data: |
Carries out 100 Hours of continuous /Dynamic A-Scan and Recording. B-scan recording (in 8 GB SD Card) which can be replayed and analyzed in Machine as well as PC. |
Color B-Scan: |
Real time Color coded Un-Encoded B-Scan along with A-Scan on the Screen which can be transferred to PC. Analysis of A-Scan and B-Scan can be done in the machine as well as on a PC. |
Digital Readout: |
Thickness/Depth can be displayed in digital readout when using a normal probe and Sound path; Surface Distance and Depth are directly displayed when angle probe is in use. |