Simplified for Testing All Parameters of CR Scanner Systems
A Smaller, Simpler CR Phantom
The Basic CR Phantom 6" x 10” (160 mm x 250 mm) is a simplified version of the 14x17” panel. Meets all requirements for testing relevant parameters of CR Scanner Systems, like basic spatial resolution (with added duplex iqi), unsharpness, contrast, MTF, laser beam jitter, scanner slipping and shading. These tests are performed periodically according to ASTM E 2445, ISO 16371-1 and EN 14784-1 standards.
Insertable / removable Duplex IQIs (cost savings for customers who already have the duplex)
Complete test evaluation is possible with one exposure using IP of only 4" (10 cm) – all IQIs will fit on this width. For linearity check the 1 mm balls can be used which are also in this 10 cm width range.
Smaller T Target. Tests can be performed as usual
No Duplex IQIs. Duplex IQI’s must be purchased separately. They can be added or removed from the designated cut outs as needed.
No Line Pair Gauges, type 39. Duplex IQI can be used for resolution tests.
Additional Linearity Check test. Tungsten balls (dia. 1.5 mm) with 25 mm distance for i.e. only 10 cm (4 inch) wide IPs.
No Positioning Locator. As a substitute there are 4 arrows in the middle of each edge to show center of panel.
Smaller Al strip. Tests can be performed as usual.
No Contrast Sensitivity Gauge – CU. Not necessary as at 90 kV copper cannot be irradiated.
(Numbers refer to the diagram on the right)
T-Target - Brass
Laser beam jitter, MFT check, blooming (Flare)
Duplex Wire Type IQI (If Purchased)
Basic spatial resolution, unsharpness
Central beam alignment
EL, EC, ER Measuring Points
Homogenous AL Strip
Scanning, slipping, shading
Inch / cm Ruler
Contrast Sensitivity Gauge
Contrast sensitivity check
6" x 10" x 0.65" (160 x 250 x 16.5 mm)
Scope of Supply:
CR Phantom, Type 1, ASTM E2445, no Duplex IQI, 6 x 10” (160 x 250 mm) (RT-KT-11-00218)
Test Certificates according to ASTM E 2445, EN 14784-1 and ISO 16371-1