Previously the RC-05
The JIMA RT RC-05B is a micro chart fabricated by using the latest semiconductor lithography techniques. It is used for calibration and monitoring of system resolution and ensures high quality results of your microfocus or nanofocus X-ray inspection systems. JIMA RT RC-05B supports resolutions between 3 microns and 50 microns (3 µm and 50 µm). This corresponds to focal spot sizes between 6 microns and 100 micron (6 µm and 100 µm).