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Equotip 550 Leeb Rebound Hardness Tester | HT-AU-EQUOTIP-550 |
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Equotip 550 Leeb Rebound Hardness Tester
The Equotip 550 is the most versatile all-in-one solution for portable hardness testing, combining Leeb with Portable Rockwell methods. The new generation Touchscreen with elaborate user interface increases user efficiency and exceptional user experience. Enhanced software provides interactive wizards, automatic verification processes, personalization options, customized report functions and much more.
Features:
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Applications:
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Specifications:
Instrument: | |
Display: | 7" Color Display, 800 x 480 pixels |
Memory: | Internal 8 GB Flash memory (up to 1,000,000 measurements) |
Regional Settings: | Imperial and metric units, multi-language and timezone supported |
Battery: | Lithium Polymer, 3.6V, 14.0Ah |
Battery Lifetime: | > 8 hrs. (in standard operating mode) |
Power Input: | 12V ±25% / 1.5 A |
Weight (of display device): | About 1525 g. (including battery) |
Dimensions: | 250 x 162 x 62 mm |
Max. Altitude: | 2,500 m above sea level |
Humidity: | < 95% RH, non condensing |
Operating Temperature: | 32°F to 86°F / 0°C to 30°C (Charging, running instrument) 32°F to 104°F / 0°C to 40°C (Charging, when instrument is off) 14°F to 122°F / -10°C to 50°C (Non-charging) |
Environment: | Suitable for indoor and outdoor use |
IP Classification: | IP 54 |
Pollution Degree: | 2 |
Installation Category: | 2 |
Equotip Leeb Impact Devices: | |
Measuring Range: | 1 - 9999 HL |
Measuring Accuracy: | ± 4 HL (0.5% at 800 HL) |
Resolution: | 1 HL; 1 HV; 1 HB; 0.1 HRA; 0.1 HRB; 0.1 HRC; 0.1 HS; 1 MPa (N/mm2) |
Impact Direction: | Automatic compensation (excluding DL probe) |
Impact Energy: | Energy Measurements: 11.5 Nmm for D, DC, E, S probes 11.1 Nmm for DL probe 3.0 Nmm for C probe 90.0 Nmm for G probe |
Mass of Impact Body: | Weight: 0.2 oz. / 5.45 g. for D, DC, E, S probes 0.26 oz. / 7.25 g. for DL probe 0.11 oz. / 3.10 g. for C probe 0.71 oz. / 20.0 g. for G probe |
Ball Indenter: | Material: Tungsten carbide, 0.12" / 3.0 mm diameter for C, D, DC probes Tungsten carbide, 0.11" / 2.78 mm diameter for DL probe Tungsten carbide, 0.2" / 5.0 mm diameter for G probe Ceramics, 0.12" / 3.0 mm diameter for S probe Polycrystalline diamond, 0.12" / 3.0 mm diameter for E probe |
Operating Temperature: | 14°F to 122°F / -10°C to 50°C |
Standards:
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Guidelines:
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Description | Part # | Saved | Price | Select Option | Add to |
---|---|---|---|---|---|
Equotip 550 Leeb Rebound Hardness Tester | HT-AU-EQUOTIP-550 |
|
Request Pricing |